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Multiple-Fault-Tolerant Dual Active Bridge Converter for DC Distribution System

IEEE Transactions on Power Electronics, ISSN: 1941-0107, Vol: 37, Issue: 2, Page: 1748-1760
2022
  • 45
    Citations
  • 0
    Usage
  • 21
    Captures
  • 0
    Mentions
  • 0
    Social Media
Metric Options:   Counts1 Year3 Year

Metrics Details

  • Citations
    45
    • Citation Indexes
      45
  • Captures
    21

Article Description

The dc power transmission system has been obviously attracting more research interests in recent years. In order to satisfy the high-reliability requirement of the dc power transmission system, the power converter should be able to keep uninterrupted operation after multiple unexpected faults. However, high fault-tolerant capability usually leads to the bulky redundant circuit, which increases the cost, volume, and complexity of the power converter. Thus, a fault-tolerant dual active bridge (DAB) converter is proposed to maintain the power transferring ability under multiple unexpected open-circuit faults (OCFs) conditions, which can significantly enhance the reliability of the dc power transmission system. By reconfiguring the central-tapped transformer and two symmetrical auxiliary inductors, the half-bridge conduction branch is built to maintain uninterrupted operation when a single or dual OCF has occurred. The proposed fault-tolerant strategy only requires four extra voltage sensors to detect and locate OCFs for the reconfiguration process. Thus, it significantly improves the system reliability with a low additional cost. Besides, the inductor current, transmission power, and the small-signal models of the proposed fault-tolerant converter have been presented. It proves the proposed fault-tolerant topology can smoothly switch between normal and postfault operation due to the constituency of the inductor current. Finally, the 250-W prototype is designed to verify the advantage of the proposed fault-tolerant DAB converter.

Bibliographic Details

Haochen Shi; Huiqing Wen; Qinglei Bu; Guanying Chu; Yinxiao Zhu; Guipeng Chen

Institute of Electrical and Electronics Engineers (IEEE)

Engineering

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