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Origin of optical losses in Ag/ZnO back-reflectors for thin film Si photovoltaics

Conference Record of the 2006 IEEE 4th World Conference on Photovoltaic Energy Conversion, WCPEC-4, Vol: 2, Page: 1732-1735
2006
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Conference Paper Description

Back-reflector (BR) fabrication for thin film Si solar cells has been studied using real time spectroscopic ellipsometry (SE) with a rotating compensator instrument. The structure explored here is relevant for the substrate/ BR/n-i-p configuration and consists of opaque Ag followed by ∼1500 Å of ZnO, both prepared by sputtering. The thickness of the initial roughness layer on the Ag has been varied from 6 to 55 Å to investigate its effects on interface formation between Ag and ZnO in the specular regime. The dielectric functions ε = ε + iε of all layers including an observed Ag/ZnO interface layer have been determined, and the latter has been fit using (i) a free electron component, (ii) a plasmon component near 2.8 eV, and (iii) a bound electron component with an absorption onset near 3.7 eV. The measured reflectance spectra of the final specular BR structures with ∼1500 Å thick ZnO are consistent with those predicted from SE models and allow one to identify the physical origins of losses. A strong minimum in reflectance centered at 2.6 eV and an associated tail extending to 1.6 eV is found to be caused by interference-enhanced plasmon absorption. Simulations for thicker ZnO (db = 3000 Å) demonstrate that the dominant loss from 1.2 to 1.5 eV is due to intrinsic absorption in Ag, also enhanced by interference. © 2006 IEEE.

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