Origin of optical losses in Ag/ZnO back-reflectors for thin film Si photovoltaics
Conference Record of the 2006 IEEE 4th World Conference on Photovoltaic Energy Conversion, WCPEC-4, Vol: 2, Page: 1732-1735
2006
- 11Citations
- 1Usage
- 11Captures
Metric Options: CountsSelecting the 1-year or 3-year option will change the metrics count to percentiles, illustrating how an article or review compares to other articles or reviews within the selected time period in the same journal. Selecting the 1-year option compares the metrics against other articles/reviews that were also published in the same calendar year. Selecting the 3-year option compares the metrics against other articles/reviews that were also published in the same calendar year plus the two years prior.
Example: if you select the 1-year option for an article published in 2019 and a metric category shows 90%, that means that the article or review is performing better than 90% of the other articles/reviews published in that journal in 2019. If you select the 3-year option for the same article published in 2019 and the metric category shows 90%, that means that the article or review is performing better than 90% of the other articles/reviews published in that journal in 2019, 2018 and 2017.
Citation Benchmarking is provided by Scopus and SciVal and is different from the metrics context provided by PlumX Metrics.
Example: if you select the 1-year option for an article published in 2019 and a metric category shows 90%, that means that the article or review is performing better than 90% of the other articles/reviews published in that journal in 2019. If you select the 3-year option for the same article published in 2019 and the metric category shows 90%, that means that the article or review is performing better than 90% of the other articles/reviews published in that journal in 2019, 2018 and 2017.
Citation Benchmarking is provided by Scopus and SciVal and is different from the metrics context provided by PlumX Metrics.
Metrics Details
- Citations11
- Citation Indexes11
- 11
- CrossRef1
- Usage1
- Abstract Views1
- Captures11
- Readers11
- 11
Conference Paper Description
Back-reflector (BR) fabrication for thin film Si solar cells has been studied using real time spectroscopic ellipsometry (SE) with a rotating compensator instrument. The structure explored here is relevant for the substrate/ BR/n-i-p configuration and consists of opaque Ag followed by ∼1500 Å of ZnO, both prepared by sputtering. The thickness of the initial roughness layer on the Ag has been varied from 6 to 55 Å to investigate its effects on interface formation between Ag and ZnO in the specular regime. The dielectric functions ε = ε + iε of all layers including an observed Ag/ZnO interface layer have been determined, and the latter has been fit using (i) a free electron component, (ii) a plasmon component near 2.8 eV, and (iii) a bound electron component with an absorption onset near 3.7 eV. The measured reflectance spectra of the final specular BR structures with ∼1500 Å thick ZnO are consistent with those predicted from SE models and allow one to identify the physical origins of losses. A strong minimum in reflectance centered at 2.6 eV and an associated tail extending to 1.6 eV is found to be caused by interference-enhanced plasmon absorption. Simulations for thicker ZnO (db = 3000 Å) demonstrate that the dominant loss from 1.2 to 1.5 eV is due to intrinsic absorption in Ag, also enhanced by interference. © 2006 IEEE.
Bibliographic Details
http://www.scopus.com/inward/record.url?partnerID=HzOxMe3b&scp=41749115144&origin=inward; http://dx.doi.org/10.1109/wcpec.2006.279826; http://ieeexplore.ieee.org/document/4059992/; http://xplorestaging.ieee.org/ielx5/4059527/4059868/04059992.pdf?arnumber=4059992; https://scholar.rose-hulman.edu/physics_fac/357; https://scholar.rose-hulman.edu/cgi/viewcontent.cgi?article=1356&context=physics_fac
Institute of Electrical and Electronics Engineers (IEEE)
Provide Feedback
Have ideas for a new metric? Would you like to see something else here?Let us know