Spectral ellipsometry of monolayer transition metal dichalcogenides: Analysis of excitonic peaks in dispersion
Journal of Vacuum Science and Technology B: Nanotechnology and Microelectronics, ISSN: 2166-2754, Vol: 38, Issue: 1
2020
- 52Citations
- 55Captures
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Article Description
Optical constants of monolayers MoS and WS were measured by spectroscopic ellipsometry in the spectral range 365-1700 nm. Analysis of ellipsometry spectra was carried out, taking into account the excitonic nature of dispersion. In the considered wavelength range, excitons originate from different interband transitions. As a result, they can be described via Tauc-Lorentz oscillators, one for each exciton. The scalability and universality of such an approach could be applied for the extended wavelength range and to the other transition metal dichalcogenides.
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