X-ray Fourier ptychography
Science Advances, ISSN: 2375-2548, Vol: 5, Issue: 2, Page: eaav0282
2019
- 49Citations
- 137Captures
- 6Mentions
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Example: if you select the 1-year option for an article published in 2019 and a metric category shows 90%, that means that the article or review is performing better than 90% of the other articles/reviews published in that journal in 2019. If you select the 3-year option for the same article published in 2019 and the metric category shows 90%, that means that the article or review is performing better than 90% of the other articles/reviews published in that journal in 2019, 2018 and 2017.
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Example: if you select the 1-year option for an article published in 2019 and a metric category shows 90%, that means that the article or review is performing better than 90% of the other articles/reviews published in that journal in 2019. If you select the 3-year option for the same article published in 2019 and the metric category shows 90%, that means that the article or review is performing better than 90% of the other articles/reviews published in that journal in 2019, 2018 and 2017.
Citation Benchmarking is provided by Scopus and SciVal and is different from the metrics context provided by PlumX Metrics.
Metrics Details
- Citations49
- Citation Indexes49
- 49
- CrossRef35
- Captures137
- Readers137
- 137
- Mentions6
- News Mentions6
- 6
Most Recent News
Ptychography: A solution to the phase problem
Over the past 15 years, ptychography applications and methods have advanced significantly. Ptychography is a computational microscopy technique for acquiring images with resolutions beyond the
Article Description
To a large extent, the performance of imaging systems is determined by their objectives, which affect properties as varied as collection efficiency, resolving power, and image distortions. Such limitations can be addressed by so-called aperture synthesis, a technique used, for instance, in radar, astronomy, and, increasingly, microscopy. Here, we apply such techniques to x-ray imaging and demonstrate how Fourier ptychography can be used at transmission x-ray microscopes to increase resolution, provide quantitative absorption and phase contrast, and allow for corrections of lens aberrations. We anticipate that such methods will find common and frequent applications, alleviating a number of limitations imposed by x-ray optical elements, offering an alternative approach to phase contrast imaging, and providing novel opportunities to mitigate radiation damage.
Bibliographic Details
http://www.scopus.com/inward/record.url?partnerID=HzOxMe3b&scp=85060998426&origin=inward; http://dx.doi.org/10.1126/sciadv.aav0282; http://www.ncbi.nlm.nih.gov/pubmed/30746489; https://www.science.org/doi/10.1126/sciadv.aav0282; http://hdl.handle.net/20.500.11850/324062; http://dx.doi.org/10.3929/ethz-b-000324062; https://dx.doi.org/10.3929/ethz-b-000324062; https://www.research-collection.ethz.ch/handle/20.500.11850/324062; https://dx.doi.org/10.1126/sciadv.aav0282; https://advances.sciencemag.org/content/5/2/eaav0282; https://advances.sciencemag.org/content/5/2/eaav0282.abstract; https://advances.sciencemag.org/content/advances/5/2/eaav0282.full.pdf; http://advances.sciencemag.org/lookup/doi/10.1126/sciadv.aav0282; https://www.research-collection.ethz.ch/bitstream/20.500.11850/324062/2/eaav0282.full.pdf
American Association for the Advancement of Science (AAAS)
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