PlumX Metrics
Embed PlumX Metrics

Depth of formation of a reflected soft x-ray beam under conditions of specular reflection

Physics of the Solid State, ISSN: 1063-7834, Vol: 40, Issue: 7, Page: 1237-1240
1998
  • 11
    Citations
  • 0
    Usage
  • 4
    Captures
  • 0
    Mentions
  • 0
    Social Media
Metric Options:   Counts1 Year3 Year

Metrics Details

  • Citations
    11
    • Citation Indexes
      11
  • Captures
    4

Article Description

Over a wide range of glancing-incidence angles, bremsstrahlung from an x-ray tube was used to measure the reflection spectra of an Si-SiO system with different dioxide thickness near the Si L ionization threshold. The angular dependence of the depth of formation of the reflected soft x-ray beam was determined experimentally and compared with that obtained from a theoretical analysis of the interaction between electromagnetic radiation and the surface of an isotropic solid. © 1998 American Institute of Physics.

Provide Feedback

Have ideas for a new metric? Would you like to see something else here?Let us know