Effects of process parameters on the optical constants of highly textured VO thin films
Optics and Spectroscopy (English translation of Optika i Spektroskopiya), ISSN: 1562-6911, Vol: 117, Issue: 3, Page: 423-427
2014
- 7Citations
- 12Captures
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Article Description
The optical properties of the highly-textured VO thin-films grown on Si(100) by sputter-deposition at various oxygen reactive-pressures were investigated in detail. The profiles of the optical constants, namely the refractive index and extinction coefficient, of VO films were evaluated in the photon-energy range of 1–5 eV. At photon-energy above 2.5 eV, the dispersion behavior in optical constants is explained based on Lorentz-Drude model. The refractive index dispersion fits to a Cauchy’s relation at photon-energy below 2.5 eV, where the VO-film is mostly transparent. The optical transitions across the bandgap occur at energy ∼2.5–3.2 eV depending on the VO growth conditions and film-microstructure. The highly-textured and c-axis oriented VO-films, fabricated under optimum conditions of temperature and oxygen partial pressure, exhibit excellent optical characteristics similar to VO single crystals.
Bibliographic Details
http://www.scopus.com/inward/record.url?partnerID=HzOxMe3b&scp=84920114321&origin=inward; http://dx.doi.org/10.1134/s0030400x14090033; http://link.springer.com/10.1134/S0030400X14090033; http://link.springer.com/content/pdf/10.1134/S0030400X14090033; http://link.springer.com/content/pdf/10.1134/S0030400X14090033.pdf; http://link.springer.com/article/10.1134/S0030400X14090033/fulltext.html; https://dx.doi.org/10.1134/s0030400x14090033; https://link.springer.com/article/10.1134/S0030400X14090033
Pleiades Publishing Ltd
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