PlumX Metrics
Embed PlumX Metrics

Achieving 63 pm resolution in scanning transmission electron microscope with spherical aberration corrector

Japanese Journal of Applied Physics, Part 2: Letters, ISSN: 0021-4922, Vol: 46, Issue: 20-24
2007
  • 61
    Citations
  • 0
    Usage
  • 32
    Captures
  • 0
    Mentions
  • 0
    Social Media
Metric Options:   Counts1 Year3 Year

Metrics Details

  • Citations
    61
    • Citation Indexes
      61
  • Captures
    32

Article Description

The performance of a newly developed high-resolution 300kV microscope equipped with a spherical aberration corrector for probe-forming systems is reported. This microscope gave the highest resolution for the distance between atomic columns, as determined by a high-angle annular dark field imaging method using a GaN[211] crystalline specimen, where the distance between the neighboring columns of Ga was 63 pm. © 2007 The Japan Society of Applied Physics.

Provide Feedback

Have ideas for a new metric? Would you like to see something else here?Let us know