Simple analytical model to study the ZTC bias point in FinFETs
ECS Transactions, ISSN: 1938-6737, Vol: 6, Issue: 4, Page: 205-209
2007
- 2Citations
- 2Captures
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Conference Paper Description
In this work we present a simple analytical model to study the Zero Temperature Coefficient (ZTC) bias point in FinFETs operating from room temperature up to 573 K. Three-dimensional simulations are carried out and compared with experimental results to qualify the results. © The Electrochemical Society.
Bibliographic Details
http://www.scopus.com/inward/record.url?partnerID=HzOxMe3b&scp=45249103332&origin=inward; http://dx.doi.org/10.1149/1.2728862; https://iopscience.iop.org/article/10.1149/1.2728862; https://dx.doi.org/10.1149/1.2728862; https://validate.perfdrive.com/9730847aceed30627ebd520e46ee70b2/?ssa=029e2b0b-9848-4900-b080-a32b5b59ecbe&ssb=22528225671&ssc=https%3A%2F%2Fiopscience.iop.org%2Farticle%2F10.1149%2F1.2728862&ssi=edf76f71-cnvj-44d2-a3bb-e1e3782ed922&ssk=botmanager_support@radware.com&ssm=28758848806273259870911270117892376&ssn=38e45790b925467f0e9ef3a24544a64ec1269257b256-2e92-4da1-adb39e&sso=c5c1f013-e6f1be2ceeb889edf6a35bd2b0da62e43a20a7c6765f1c84&ssp=06922527561731268632173191644289690&ssq=44148736051153031892475300079660260310957&ssr=NTIuMy4yMTcuMjU0&sst=com.plumanalytics&ssu=&ssv=&ssw=&ssx=eyJ1em14IjoiN2Y5MDAwOWM3MzVmYWUtMDU4Yi00MTQ5LWExM2ItZDMxNjY4ZTM0ZGFlOS0xNzMxMjc1MzAwNDc1Njg1MjExMzkzLWQzOTZjY2E1NDU4ZmVmNWY4NzA4OCIsIl9fdXptZiI6IjdmNjAwMDhjOWYwZTc0LTRiZjMtNGJlYy1iNGI4LTdkMjkwYmI4M2RlNTE3MzEyNzUzMDA0NzU2ODUyMTEzOTMtZWUxYjZjNTc4OTEyN2Q2Mjg3MDg4IiwicmQiOiJpb3Aub3JnIn0=
The Electrochemical Society
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