Anti-reflective nano- and micro-structures on 4h-sic for photodiodes
Nanoscale Research Letters, ISSN: 1556-276X, Vol: 6, Issue: 1, Page: 236
2011
- 10Citations
- 19Captures
Metric Options: CountsSelecting the 1-year or 3-year option will change the metrics count to percentiles, illustrating how an article or review compares to other articles or reviews within the selected time period in the same journal. Selecting the 1-year option compares the metrics against other articles/reviews that were also published in the same calendar year. Selecting the 3-year option compares the metrics against other articles/reviews that were also published in the same calendar year plus the two years prior.
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Example: if you select the 1-year option for an article published in 2019 and a metric category shows 90%, that means that the article or review is performing better than 90% of the other articles/reviews published in that journal in 2019. If you select the 3-year option for the same article published in 2019 and the metric category shows 90%, that means that the article or review is performing better than 90% of the other articles/reviews published in that journal in 2019, 2018 and 2017.
Citation Benchmarking is provided by Scopus and SciVal and is different from the metrics context provided by PlumX Metrics.
Metrics Details
- Citations10
- Citation Indexes10
- 10
- CrossRef8
- Captures19
- Readers19
- 19
Article Description
In this study, nano-scale honeycomb-shaped structures with anti-reflection properties were successfully formed on SiC. The surface of 4H-SiC wafer after a conventional photolithography process was etched by inductively coupled plasma. We demonstrate that the reflection characteristic of the fabricated photodiodes has significantly reduced by 55% compared with the reference devices. As a result, the optical response I/I of the 4H-SiC photodiodes were enhanced up to 178%, which can be ascribed primarily to the improved light trapping in the proposed nano-scale texturing. © 2011 Kang et al.
Bibliographic Details
http://www.scopus.com/inward/record.url?partnerID=HzOxMe3b&scp=84255189767&origin=inward; http://dx.doi.org/10.1186/1556-276x-6-236; http://www.ncbi.nlm.nih.gov/pubmed/21711744; https://link.springer.com/10.1186/1556-276X-6-236; http://nanoscalereslett.springeropen.com/articles/10.1186/1556-276X-6-236; https://dx.doi.org/10.1186/1556-276x-6-236; https://link.springer.com/article/10.1186/1556-276X-6-236
Springer Science and Business Media LLC
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