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Analyzing the microstructure and related properties of 2D materials by transmission electron microscopy

Applied Microscopy, ISSN: 2287-4445, Vol: 49, Issue: 1, Page: 10
2019
  • 16
    Citations
  • 0
    Usage
  • 54
    Captures
  • 1
    Mentions
  • 7
    Social Media
Metric Options:   Counts1 Year3 Year

Metrics Details

  • Citations
    16
  • Captures
    54
  • Mentions
    1
    • News Mentions
      1
      • News
        1
  • Social Media
    7
    • Shares, Likes & Comments
      7
      • Facebook
        7

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Review Description

Two-dimensional materials such as transition metal dichalcogenide and graphene are of great interest due to their intriguing electronic and optical properties such as metal-insulator transition based on structural variation. Accordingly, detailed analyses of structural tunability with transmission electron microscopy have become increasingly important for understanding atomic configurations. This review presents a few analyses that can be applied to two-dimensional materials using transmission electron microscopy.

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