Near infrared emission from defect states of atomically thin phosphorene
Optics InfoBase Conference Papers, ISSN: 2162-2701, Vol: Part F41-CLEO_SI 2017, Page: 1-2
2017
- 1Citations
- 6Captures
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Conference Paper Description
We demonstrate a new class of near infrared localized defects in few layer phosphorene. This work highlights the significance of defect states of phosphorene for near infrared optoelectronic applications.
Bibliographic Details
http://www.scopus.com/inward/record.url?partnerID=HzOxMe3b&scp=85020261561&origin=inward; http://dx.doi.org/10.1364/cleo_si.2017.sw4k.4; http://www.scopus.com/inward/record.url?partnerID=HzOxMe3b&scp=85044433500&origin=inward; https://www.osapublishing.org/abstract.cfm?URI=CLEO_SI-2017-SW4K.4; https://www.osapublishing.org/viewmedia.cfm?URI=CLEO_SI-2017-SW4K.4&seq=0; https://opg.optica.org/abstract.cfm?URI=CLEO_SI-2017-SW4K.4; https://dx.doi.org/10.1364/cleo_si.2017.sw4k.4
The Optical Society
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