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Near-field Raman imaging using optically trapped dielectric microsphere

Optics Express, ISSN: 1094-4087, Vol: 16, Issue: 11, Page: 7976-7984
2008
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Article Description

The stumbling block of employing Raman imaging in nanoscience and nanotechnology is the diffraction-limited spatial resolution. Several approaches have been employed to improve the spatial resolution, among which aperture and apertureless near-field Raman techniques are the most frequently used. In this letter, we report a new approach in doing near-field Raman imaging with spatial resolution of about 80 nm, by trapping and scanning a polystyrene microsphere over the sample surface in water. We have used this technique to resolve PMOS transistors with SiGe source drain stressors with poly-Si gates, as well as gold nanopatterns with excellent reproducibility. ©2008 Optical Society of America.

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