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Specimen preparation for three-dimensional atom probe using the focused ion-beam lift-out technique

Journal of Surface Analysis, ISSN: 1341-1756, Vol: 17, Issue: 3, Page: 292-295
2011
  • 1
    Citations
  • 0
    Usage
  • 3
    Captures
  • 0
    Mentions
  • 0
    Social Media
Metric Options:   Counts1 Year3 Year

Metrics Details

  • Citations
    1
    • Citation Indexes
      1
      • CrossRef
        1
  • Captures
    3

Article Description

Journal of Surface Analysis

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