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Stress-Driven Recrystallization of Pentacene Films Via Diffusion-Induced Ingress of Mof Nanocrystals into the Grain Boundaries

SSRN, ISSN: 1556-5068
2023
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  • Usage
    142
    • Abstract Views
      123
    • Downloads
      19

Article Description

Highlights• MOF nanocrystals are inducted into the grain boundaries of pentacene thin film for successful exploitation of material’s properties.• Uniform growth of MOF film was confirmed over 10 (±2) nm thick pentacene surfaces.• MOF nanocrystals diffused into the grain boundaries of pentacene films and develop a compressive strain that leads to a diffusion induced recrystallization.

Bibliographic Details

Dipak Kumar Goswami; Samik Mallik; Shyam Chand Pal; Sovanlal Mondal; Prasanta Kumar Guha; Madhab C. Das

Elsevier BV

Multidisciplinary; metal-organic frameworks (MOFs); diffusion into grain boundaries; compressive stress; X-ray reflectivity; recrystallization

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