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Properties of the adsorption layer in a binary liquid mixture near the critical point

Moscow University Physics Bulletin, ISSN: 0027-1349, Vol: 66, Issue: 2, Page: 180-183
2011
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Article Description

A method for the determination of parameters of the surface layer (thickness and refraction index) at the liquid-vapor interface in binary liquid mixtures was developed. The parameters of the surface layer for the CH-CF liquid mixture in the vicinity of the critical point, which was studied by means of ellipsometry in [1], were calculated using the proposed method. The temperature dependences of the thickness and refraction index that were determined in the homogeneous isotropic layer approximation at the interface liquid-vapor, show structural peculiarities that were not observed earlier. Their appearance is explained by the possible influence of hydrodynamic processes at the boundary. © 2011 Allerton Press, Inc.

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