upU-Net Approaches for Background Emission Removal in Fluorescence Microscopy
Journal of Imaging, ISSN: 2313-433X, Vol: 8, Issue: 5
2022
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Example: if you select the 1-year option for an article published in 2019 and a metric category shows 90%, that means that the article or review is performing better than 90% of the other articles/reviews published in that journal in 2019. If you select the 3-year option for the same article published in 2019 and the metric category shows 90%, that means that the article or review is performing better than 90% of the other articles/reviews published in that journal in 2019, 2018 and 2017.
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J. Imaging, Vol. 8, Pages 142: upU-Net Approaches for Background Emission Removal in Fluorescence Microscopy
J. Imaging, Vol. 8, Pages 142: upU-Net Approaches for Background Emission Removal in Fluorescence Microscopy Journal of Imaging doi: 10.3390/jimaging8050142 Authors: Alessandro Benfenati The physical
Article Description
The physical process underlying microscopy imaging suffers from several issues: some of them include the blurring effect due to the Point Spread Function, the presence of Gaussian or Poisson noise, or even a mixture of these two types of perturbation. Among them, auto–fluorescence presents other artifacts in the registered image, and such fluorescence may be an important obstacle in correctly recognizing objects and organisms in the image. For example, particle tracking may suffer from the presence of this kind of perturbation. The objective of this work is to employ Deep Learning techniques, in the form of U-Nets like architectures, for background emission removal. Such fluorescence is modeled by Perlin noise, which reveals to be a suitable candidate for simulating such a phenomenon. The proposed architecture succeeds in removing the fluorescence, and at the same time, it acts as a denoiser for both Gaussian and Poisson noise. The performance of this approach is furthermore assessed on actual microscopy images and by employing the restored images for particle recognition.
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