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Two-Color-Thermography for Temperature Determination in Laser Beam Welding of Low-Melting Materials

Sensors, ISSN: 1424-8220, Vol: 23, Issue: 10
2023
  • 5
    Citations
  • 0
    Usage
  • 6
    Captures
  • 1
    Mentions
  • 0
    Social Media
Metric Options:   Counts1 Year3 Year

Metrics Details

  • Citations
    5
  • Captures
    6
  • Mentions
    1
    • News Mentions
      1
      • 1

Most Recent News

Friedrich-Alexander-University Erlangen-Nurnberg (FAU) Researcher Adds New Findings in the Area of Sensor Research (Two-Color-Thermography for Temperature Determination in Laser Beam Welding of Low-Melting Materials)

2023 JUN 06 (NewsRx) -- By a News Reporter-Staff News Editor at Tech Daily News -- Data detailed on sensor research have been presented. According

Article Description

Spatial and temporal knowledge of temperature evolution is crucial in laser beam welding of low-melting materials such as aluminum alloys. Current temperature measurements are restricted to (i) one-dimensional temperature information (e.g., ratio-pyrometers), (ii) a priori knowledge of emissivity (e.g., thermography), and (iii) high-temperature regions (e.g., two-color-thermography). This study presents a ratio-based two-color-thermography system that enables acquiring spatially and temporally resolved temperature information for low-melting temperature ranges (<1200 K). The study demonstrates that temperature can be accurately determined despite variations in signal intensity and emissivity for objects emitting constant thermal radiation. The two-color-thermography system is further transferred into a commercial laser beam welding set-up. Experiments with varying process parameters are conducted, and the ability of the thermal imaging method to measure dynamic temperature behavior is assessed. Image artifacts presumably caused by internal reflections inside the optical beam path limit the direct application of the developed two-color-thermography system during dynamic temperature evolution.

Bibliographic Details

Schwarzkopf, Karen; Rothfelder, Richard; Rasch, Michael; Schmidt, Michael

MDPI AG

Chemistry; Computer Science; Physics and Astronomy; Biochemistry, Genetics and Molecular Biology; Engineering

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