Fabrication of nano-structure by STM tip induced atomic diffusion
Key Engineering Materials, ISSN: 1662-9795, Vol: 270-273, Issue: I, Page: 866-871
2004
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Example: if you select the 1-year option for an article published in 2019 and a metric category shows 90%, that means that the article or review is performing better than 90% of the other articles/reviews published in that journal in 2019. If you select the 3-year option for the same article published in 2019 and the metric category shows 90%, that means that the article or review is performing better than 90% of the other articles/reviews published in that journal in 2019, 2018 and 2017.
Citation Benchmarking is provided by Scopus and SciVal and is different from the metrics context provided by PlumX Metrics.
Metrics Details
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Conference Paper Description
By a scanning tunneling microscope (STM), atomic diffusion on the Au(111) surface was observed at the local area where a voltage pulse applied. The applied voltage pulse played a role as a trigger for atomic diffusion, which was induced by a tip-sample interaction during scanning. The direction of atomic diffusion was highly dependent on the scan direction. In the STM configuration, the tip-induced local atomic diffusion would be explained by the electric field effect for ions or polarized atoms between a tip and a sample surface.
Bibliographic Details
http://www.scopus.com/inward/record.url?partnerID=HzOxMe3b&scp=8644251825&origin=inward; http://dx.doi.org/10.4028/www.scientific.net/kem.270-273.866; https://www.scientific.net/KEM.270-273.866; http://www.scientific.net/KEM.270-273.866; http://www.scientific.net/KEM.270-273.866.pdf; https://dx.doi.org/10.4028/www.scientific.net/kem.270-273.866
Trans Tech Publications, Ltd.
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