BiTiO and BiLa TiO thin films prepared by RF magnetron sputtering
Key Engineering Materials, ISSN: 1662-9795, Vol: 434-435, Page: 296-299
2010
- 1Captures
Metric Options: CountsSelecting the 1-year or 3-year option will change the metrics count to percentiles, illustrating how an article or review compares to other articles or reviews within the selected time period in the same journal. Selecting the 1-year option compares the metrics against other articles/reviews that were also published in the same calendar year. Selecting the 3-year option compares the metrics against other articles/reviews that were also published in the same calendar year plus the two years prior.
Example: if you select the 1-year option for an article published in 2019 and a metric category shows 90%, that means that the article or review is performing better than 90% of the other articles/reviews published in that journal in 2019. If you select the 3-year option for the same article published in 2019 and the metric category shows 90%, that means that the article or review is performing better than 90% of the other articles/reviews published in that journal in 2019, 2018 and 2017.
Citation Benchmarking is provided by Scopus and SciVal and is different from the metrics context provided by PlumX Metrics.
Example: if you select the 1-year option for an article published in 2019 and a metric category shows 90%, that means that the article or review is performing better than 90% of the other articles/reviews published in that journal in 2019. If you select the 3-year option for the same article published in 2019 and the metric category shows 90%, that means that the article or review is performing better than 90% of the other articles/reviews published in that journal in 2019, 2018 and 2017.
Citation Benchmarking is provided by Scopus and SciVal and is different from the metrics context provided by PlumX Metrics.
Metrics Details
- Captures1
- Readers1
Conference Paper Description
BiTiO (BTO) and Bi LaTiO (BLT) ferroelectric thin films were deposited on Pt/Si substrates by RF magnetron sputtering with BiTiO (BTO) and BiLa TiO (BLT) targets with 50-mm diameter and 5-mm thickness. The microstructure and ferroelectric properties of thin films were investigated. The grain growth behavior and ferroelectric properties such as remanent polarization were different in these two kinds of film, the effects of La doping in the BLT thin film were very obvious. © (2010) Trans Tech Publications.
Bibliographic Details
http://www.scopus.com/inward/record.url?partnerID=HzOxMe3b&scp=77955461178&origin=inward; http://dx.doi.org/10.4028/www.scientific.net/kem.434-435.296; https://www.scientific.net/KEM.434-435.296; https://www.scientific.net/KEM.434-435.296.pdf; http://www.scientific.net/KEM.434-435.296; http://www.scientific.net/KEM.434-435.296.pdf; https://dx.doi.org/10.4028/www.scientific.net/kem.434-435.296
Trans Tech Publications, Ltd.
Provide Feedback
Have ideas for a new metric? Would you like to see something else here?Let us know