PlumX Metrics
Embed PlumX Metrics

Charging effects of SiO2 thin films under defocused electron beam irradiation

Acta Physica Sinica, ISSN: 1000-3290, Vol: 61, Issue: 2, Page: 027302-1-027302-8
2012
  • 4
    Citations
  • 0
    Usage
  • 1
    Captures
  • 0
    Mentions
  • 0
    Social Media
Metric Options:   Counts1 Year3 Year

Metrics Details

Article Description

Acta Physica Sinica

Bibliographic Details

Li Wei-Qin; Zhang Hai-Bo; Lu Jun

Acta Physica Sinica, Chinese Physical Society and Institute of Physics, Chinese Academy of Sciences

Provide Feedback

Have ideas for a new metric? Would you like to see something else here?Let us know